SDD 2008 - Call for Papers

CALL FOR PAPERS

Scope and Mission -- Author Information -- Committees

Scope and Mission

Troubleshooting how and why systems and circuits fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for R&D, or just getting a working first prototype. This detective work can however become very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time-to-market, the traditional focus on only pass/fail testing and missing tool and equipment capabilities. New and efficient solutions for debug and diagnosis will have a much needed and highly visible impact on productivity.

SDD08 will be held in San Diego, California, USA. It is the fifth in a series of highly successful technical workshops. Its mission and objective is to consider all issues related to debug and diagnosis of systems and circuits – from prototype bring-up to volume production.

The topics of interest include, but are not limited to, the following:

Debug Techniques and Methodologies
Design and Synthesis for Debug
DFT Reuse for Debug and Diagnosis
Debug & Diagnosis Architectures Tools
Debug Standardization
Microprocessor, FPGA, IP, SOC Debug
Infrastructure IP for SDD
Debug & Diagnosis Architectures
Manufacturing & Prototype Environment
Equipment Impact and Techniques
Digital/Analog Turn-on
Cross-geography turn-on, debug & diagnosis issues
SDD vs. Yield & TTM
Case Studies

Author Information

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The workshop objective is to facilitate a valuable interactive information exchange. Contributions ranging from extended abstracts to full papers are acceptable for submission. Contributions that provide more detail have a higher chance of being accepted. Proposals that describe open issues, industry/technology needs or opinions are also welcome.

Length Guideline: ranging from a one page, extended abstract up to 8 pages
Submissions due: March 7th, 2008
Acceptance Notification: March 21st, 2008
Final papers for inclusion into informal proceedings: April 1st, 2008

Proposals for discussion panels and other special sessions are also invited. Please submit a one page abstract for these to the web site or contact the Program Chair or Special Sessions Chair.

For general information contact:

Fidel Muradali
National Semiconductors
Email: fidel.muradali@nsc.com

For submission & program information contact:

Bart Vermeulen
NXP Semiconductors
Email: bart.vermeulen@nxp.com

Committees

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General Chair
F. Muradali – National Semiconductor

Program Chair
B. Vermeulen – NXP Semiconductors

Finance Chair
M. Ricchetti – AMD

Special Sessions
T. McLaurin – ARM

Asian Liaison
K. Hatayama – STARC

European Liaison
D. Appello - STMicroelectronics

University Liaison
N. Nicolici – McMaster Univ.

Local Arrangements
TBD

Electronic Media
I. Bayraktaroglu – Sun

Program Committee
M. Abramovici – DAFCA
C. Boit – TU Berlin
W-T Cheng – Mentor Graphics
B. Cory – nVidia
A. Crouch – Inovys
J. Giacobbe – Intel
S. Gupta - USC
I. Hartanto – Xilinx
Y-C. Hsu – Novas
D. Josephson – Intel
R. Kapur – Synopsys
H. Kerkhoff – Univ. Twente
C. Landrault – LIRMM
C. Metra – Univ. Bologna
Y. Okuda – Sony
A. Orailoglu – UCSD
P. Prinetto – Poli. Di Torino
M. Renovell – LIRMM
M.S. Reorda – Poli. Di Torino
N. Stollon – HDLdynamics
C. Sul – Silicon Image
J. Tyzer – U. Poznan
S. Venkataraman – Intel
B. West
Z. Zilic – McGill Univ.

Steering Committee
R. Aitken – ARM
F. Muradali – National Semiconductor
E.J. Marinissen – NXP Semi.
M. Ricchetti – AMD (Chair)
Y. Zorian – Virage Logic

For more information, visit us on the web at: http://www.sdd-online.org

The 5th IEEE International Workshop on Silicon Debug and Diagnosis (SDD07) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).